Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits (Frontiers in Electronic Testing Volume 17)

Rating:
Summary: Not a good book for ATE
Review: It seems to me it is just a summary of work done by others in
the ATE field over the years. The explanations of how a device
fault is detected are not clear in most of the cases presented
in the book. The book emphasizes too much on fault
modeling but not enough on test applications and techniques.

Certainly not a good text book for students nor it
is a good book for ATE engineers. However, if you are looking
for some quick reference, this book is a good place to start
because it contains brief summaries of other people's work.

Rating:
Summary: Excellent textbook for VLSI testing.
Review: This book is, as far as I know, the most comprehensive texbook on VLSI testing available at the moment. It is based on current trends and techniques in the field. After all, the authors are pioneers in this area. A worthy successor to Abramovici's earlier textbook, which, I think is beginning to look increasingly archaic. As a guy who's taken a course in testing by the authors (we were the guinea pigs for the book, actually)and is currently working in the VLSI testing area, I strongly recommend it to anyone looking to build strong testing fundamentals.